Optical alignment tool

ABSTRACT

Provided is an inspection apparatus including: (a) a translucent or transparent plate having a bottom surface, at least a portion of the bottom surface having an opaque material printed thereon in a pattern having at least one transparent or translucent portion; and (b) a chamber disposed below the bottom surface, whereby light emitted from the chamber or through the chamber can pass through the at least one transparent or translucent portion.

This application is based on, and claims the benefit of, U.S.Provisional Application No. 61/871,181, filed Aug. 28, 2013, which isincorporated herein by reference in its entirety.

BACKGROUND

Embodiments of the present disclosure relate generally to apparatus andmethods useful for alignment and validation of imaging modules used in,for example, optical detection of samples such as those samples detectedin nucleic acid sequencing procedures.

There is a need for tools which facilitate accurate calibration ofalignment and validation of optical detection systems. Embodiments ofthe invention set forth herein satisfy this need and provide otheradvantages as well.

BRIEF SUMMARY

The present disclosure provides an inspection apparatus including: (a) atranslucent or transparent plate having a bottom surface, at least aportion of the bottom surface having an opaque material printed thereonin a pattern having at least one transparent or translucent portion; and(b) a chamber disposed below the bottom surface, whereby light emittedfrom the chamber or through the chamber can pass through the at leastone transparent or translucent portion.

The inspection apparatus can optionally include (c) a fluid filling atleast a portion of the channel, the fluid containing at least one lightemitting material. The light emitting material can include one or morefluorescent or luminescent molecules. For example, the fluorescentmolecules can be a Rhodamine dye or an Oxazine dye.

An inspection apparatus of the present disclosure can also include asecond plate in contact with the translucent or transparent plate,wherein the channel opening is disposed between the translucent ortransparent plate and the second plate. The channel can be etched in thebottom surface of the translucent or transparent plate or in the topsurface of the second plate. In some embodiments the channel is formedby a spacer between the plates.

In particular embodiments, a pattern of opaque material that is on thesurface of a plate can include at least one translucent or transparentfeature forming a fiducial element in an opaque region.

In particular embodiments, a pattern of opaque material that is on thesurface of a plate can include at least one opaque feature forming afiducial element in a translucent region.

In particular embodiments, a pattern of opaque material that is on thesurface of a plate can include a plurality of translucent or transparentholes in an ordered array on an otherwise opaque region.

In particular embodiments, a pattern of opaque material that is on thesurface of a plate can include a plurality of opaque patches in anordered array on an otherwise translucent or transparent region.

An inspection apparatus of the present disclosure can be configured tosit in a flow cell cartridge of a detection instrument.

An inspection apparatus can include a channel that forms a plurality ofparallel lanes that are connected to form a single chamber. Optionally,the plurality of parallel lanes can include detection lanes that arerelatively wide compared to ingress and egress lanes that are relativelynarrow. The ingress and egress lanes can be configured to connect thedetection lanes to ingress and egress ports respectively.

In some embodiments, a channel present in an inspection apparatus canhave an ingress port having a first pressure release port, and an egressport having a second pressure release port. Optionally, the firstpressure release port is positioned along a lane that runs in adifferent direction from the direction of the ingress lane and theingress port is located at an intersection of the ingress lane and thelane that runs in a different direction from the direction of theingress lane. For example, the first pressure release port can bepositioned along a lane that runs substantially orthogonal to thedirection of the ingress lane.

If desired, a second pressure release port can be positioned along alane that runs in a different direction from the direction of the egresslane and the egress port can be located at an intersection of the egresslane and the lane that runs in a different direction from the directionof the egress lane. For example, the second pressure release port can bepositioned along a lane that runs substantially orthogonal to thedirection of the egress lane.

In some embodiments a plug material can be present to prevent flow ofliquid through a pressure release port, egress port and/or ingress port.

The bottom surface on the top plate of an inspection apparatus caninclude at least one patterned tile containing an opaque material.Alternatively or additionally, the bottom surface can further include atleast one transparent tile that lacks the opaque material.

Optionally, a patterned tile can be entirely coated by the opaquematerial. Alternatively, the opaque material can include a plurality oftransparent or translucent holes having an area less than 75 squaremicrons.

In some embodiments, the opaque material on a tile can include aplurality of transparent or translucent holes that are separated by atleast 10 microns. In one example, the opaque material can include aplurality of transparent or translucent holes having an area less than75 square microns and the opaque material can also include a transparentor translucent window having an area of at least 30,000 square microns.

Optionally, an inspection apparatus can further include at least onefiducial tile having opaque material interrupted by a transparentfiducial having a plus shape. If desired, the tiles on the surface of aninspection apparatus can be arranged in a unit on the bottom surface andthe unit can be repeated six times to form a pattern on the bottomsurface.

This disclosure also provides an inspection method for validating animaging module. The method can include steps of (a) positioning animaging module in optical alignment with an inspection apparatus setforth herein; and (b) detecting light transmitted through one or more ofthe transparent or translucent portions.

Also provided is an inspection method for aligning a camera in adetection apparatus. The method can include steps of (a) positioning acamera in optical alignment with an inspection apparatus set forthherein; and (b) detecting light transmitted through one or more of thetransparent or translucent portions.

The details of one or more embodiments are set forth in the accompanyingdrawings and the description below. Other features, objects, andadvantages will be apparent from the description and drawings, and fromthe claims.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows an optical layout for an individual microfluorometer havingorthogonal excitation and emission beam paths.

FIG. 2 shows a perspective view of an arrangement of eightmicrofluorometers for a detection apparatus.

FIG. 3 shows a top perspective view of a Y-stage for a detectionapparatus.

FIG. 4 shows a bottom perspective view of a Y stage for a detectionapparatus.

FIG. 5 shows a top perspective view of a Y-stage holding an arrangementof eight microfluorometers.

FIG. 6A shows an arrangement of four microfluorometers in relation to aflow cell having four channels.

FIG. 6B shows an arrangement of eight microfluorometers in relation to aflow cell having eight channels.

FIG. 7A shows a top view of an Ubertarget apparatus.

FIG. 7B shows a side view of a channel of an Ubertarget apparatus.

FIG. 8 shows a diagram of a back illumination scheme for an inspectionapparatus used in an inspection method.

FIG. 9 shows a diagram of an epifluorescence scheme for an inspectionapparatus used in an inspection method.

FIG. 10 shows images obtained from a NextSeq® imaging module focusedabove the metal layer of an Ubertarget apparatus (Panel A), at the metallayer (Panel B) and below the metal layer (Panel C).

FIG. 11 shows photographs of an Ubertarget in a quality control fixture(Panel A) and in a cartridge fitted to a NextSeq® sequencer (Panel B).

FIG. 12A shows an inspection apparatus having multiple channels (left)and an inspection apparatus having a single channel with multiple lanes.

FIG. 12B shows the location of printed patterns on an Ubertargetapparatus along with the image areas for the 6 cameras of a NextSeq®imaging module.

FIG. 12C shows further detail for the Mask F and Mask A regions of theUbertarget apparatus shown in FIG. 12B.

FIG. 13 shows an exemplary graphical user interface for controlling aninspection method on a computer controlled imaging device.

FIG. 14 shows an automated process flow for inspection of a NextSeq®sequencer using an Ubertarget apparatus.

FIG. 15 shows an Ubertarget apparatus having fiducials.

FIG. 16A shows directions of movement for determining hysteresis inlocating a fiducial.

FIG. 16B shows hysteresis in images obtained when locating a fiducial.

FIG. 17 shows an image of an autofocus tile of an Ubertarget apparatus.

FIG. 18 shows an image of an image quality tile of an Ubertargetapparatus.

DETAILED DESCRIPTION

The present disclosure provides an inspection apparatus for alignment(e.g. optical alignment in x, y and/or z dimensions) and validation(e.g. calibration, quantification, or characterization of opticalproperties) of imaging modules used in, for example, optical detectionof samples such as those samples detected in nucleic acid sequencingprocedures. The apparatus and methods set forth herein are particularlyuseful, for example, in alignment and validation for imaging modules setforth in U.S. patent application Ser. No. 13/766,413 filed on Feb. 13,2013, published as US 2013/0260372 A1, and entitled “INTEGRATEDOPTOELECTRONIC READ HEAD AND FLUIDIC CARTRIDGE USEFUL FOR NUCLEIC ACIDSEQUENCING,” the content of which is incorporated by reference in itsentirety.

Imaging Modules and Related Devices

Exemplary embodiments and features of the imaging modules disclosed inUS Pat. App. Pub. No. 2013/0260372 A1 are set forth below. However, itwill be appreciated that the inspection apparatus and inspection methodsset forth herein can be used for alignment and validation of any othersuitable imaging module.

This disclosure provides methods and apparatus for high-resolutiondetection of planar areas such as those present on substrate surfaces. Aparticularly useful application is optically based imaging of abiological sample that is present on a surface. For example, the methodsand apparatus set forth herein can be used to obtain images of nucleicacid features that are present in nucleic acid arrays, such as thoseused in nucleic acid sequencing applications. A variety of nucleic acidsequencing techniques that utilize optically detectable samples and/orreagents can be used. These techniques are particularly well suited tothe methods and apparatus of the present disclosure and thereforehighlight various advantages for particular embodiments of theinvention. Some of those advantages are set forth below for purposes ofillustration and, although nucleic acid sequencing applications areexemplified, the advantages can be extended to other applications aswell.

In regard to some of the examples set forth herein, salientcharacteristics of many nucleic acid sequencing techniques are (1) theuse of multicolor detection (e.g. often four different fluorophores areused, one for each of the different nucleotide types A, C, G and T (orU) present in nucleic acids), (2) distribution of large numbers ofdifferent fragments from a nucleic acid sample (e.g. fragments from agenome sample, RNA sample, or derivative thereof) onto the surface of anarray and (3) repeated cycles of fluidic processing and imaging of thearrays. Embodiments of the methods and apparatus disclosed herein areparticularly useful for nucleic acid sequencing because they can providethe capability of high resolution imaging of array surfaces in multiplecolors and in multiple repetitions. For example, embodiments set forthherein allow an image of a surface to be obtained at a resolution thatis in the range of hundreds, tens or even single digit microns. As such,nucleic acid features having nearest neighbor, average center-to-centerspacing that is lower than 100 microns, 50 microns, 10 microns, 5 micronor fewer can be resolved. In particular embodiments, wide-field imagesof surfaces can be acquired, including for example, images that cover anarea of 1 mm² or more of an array. The images can be acquired inmultiple colors simultaneously or sequentially, for example, to identifyfluorescent labels uniquely associated with different nucleotide types.Moreover, images can be acquired sequentially for multiple cycles of asequencing technique. The images from a given area of the array can bereliably compared from each cycle to determine the sequence of colorchanges detected for each nucleic acid feature on the array. Thesequence of color changes can in turn be used to infer the sequences ofthe nucleic acid fragments in each feature.

In particular embodiments, an apparatus of the present disclosureincludes one or more microfluorometers. Each of the microfluorometerscan include an excitation radiation source, a detector and an objectiveto form an integrated subunit of a read head. Other optical componentscan be present in each microfluorometer. For example a beam splitter canbe present to provide for a compact epifluorescent detectionconfiguration, whereby the beam splitter is positioned to directexcitation radiation from the excitation radiation source to theobjective and to direct emission radiation from the objective to thedetector.

An advantage of using an integrated microfluorometer design is that themicrofluorometer can be conveniently moved, for example in a scanningoperation, to allow imaging of a substrate that is larger than the fieldof view of the micro fluorometer. In particular embodiments, severalmicrofluorometers can be combined to form a read head. Variousconfigurations for the combination of read heads are set forth below andcan be selected to suit a particular format for a substrate that is tobe imaged, while maintaining relatively compact size for the overallread head. The relatively small size and low mass of the read head inseveral embodiments of the present disclosure results in relatively lowinertia such that the read head comes to rest quickly after being moved,thereby favoring rapid scanning of a nucleic acid array or othersubstrate. In some cases, the microfluorometers can be affixed to acarriage such that they are not independently moveable in at least somedimensions during the course of an analytical application such as anucleic acid sequencing run. For example, multiple microfluorometers canbe permanently fixed such that they are not independently moveable withrespect to each other in x and y dimensions (where at least one of x ory is the direction of scan). The microfluorometers may, however, beindependently actuated in the z dimension to provide for independentfocus control. Reducing degrees of freedom between several differentmicrofluorometers of an apparatus of the present disclosure provides forprotection against loss of alignment during shipping, handling and useof the apparatus.

In some embodiments, multiple microfluorometers that are present in aread head or carriage can each have a dedicated autofocus module.Accordingly, each microfluorometer can be independently focused. In someembodiments, a particular autofocus modules in a read head, althoughdedicated to actuation of a particular microfluorometer, cannevertheless receive information from at least one other autofocusmodule in the read head and the information from that particularautofocus module and from the at least one other autofocus module can beused to determine an appropriate actuation to achieve desired focus forthe particular microfluorometer. In this way focus for any givenmicrofluorometer can be determined by consensus between two or moremicrofluorometers present in the same read head or carriage.

Provided herein is a detection apparatus, having (a) a carriageincluding a plurality of microfluorometers, wherein each of themicrofluorometers includes an objective configured for wide-field imagedetection, wherein the plurality of microfluorometers is positioned tosimultaneously acquire a plurality of the wide-field images in a commonplane, and wherein each of the wide-field images is from a differentarea of the common plane; (b) a translation stage configured to move thecarriage in at least one direction parallel to the common plane; and (c)a sample stage configured to hold a substrate in the common plane.

A detection apparatus (or an individual microfluorometer) of the presentdisclosure can be used to obtain one or more images at a resolution thatis sufficient to distinguish features on a micron scale. For example, amicrofluorometer that is used in a detection apparatus can have aresolution that is sufficient to distinguish features that are separatedby at most 500 μm, 100 μm, 50 μm, 10 μm, 5 μm, 4 μm, 3 μm, 2 μm or 1 μm.Lower resolution is also possible, for example, a resolution thatdistinguishes features that are separated by more than 500 μm.

A detection apparatus (or an individual microfluorometer) of the presentdisclosure is well suited for high-resolution detection of surfaces.Accordingly, arrays having features with average spacing in the micronrange are especially useful substrates. In particular embodiments, adetection apparatus or microfluorometer can be used to obtain one ormore images of an array having features with center-to-center spacingfor nearest neighbors that is on average at or below 500 μm, 100 μm, 50μm, 10 μm, 5 μm, 4 μm, 3 μm, 2 μm or 1 μm. In many embodiments thefeatures of an array are non-contiguous being separated, for example, byless than 100 μm, 50 μm, 10 μm, 5 μm, 1 μm, or 0.5 μm. However, thefeatures need not be separated. Instead some or all of the features ofan array can be contiguous with each other.

Any of a variety of arrays (also referred to as “microarrays”) known inthe art can be used. A typical array contains features, each having anindividual probe or a population of probes. In the latter case, thepopulation of probes at each site is typically homogenous having asingle species of probe. For example, in the case of a nucleic acidarray, each feature can have multiple nucleic acid species each having acommon sequence. However, in some embodiments the populations at eachfeature of an array can be heterogeneous. Similarly, protein arrays canhave features with a single protein or a population of proteinstypically, but not always, having the same amino acid sequence. Theprobes can be attached to the surface of an array for example, viacovalent linkage of the probes to the surface or via non-covalentinteraction(s) of the probes with the surface. In some embodiments,probes, such as nucleic acid molecules, can be attached to a surface viaa gel layer as described, for example, in US 2011/0059865 A1, which isincorporated herein by reference.

Whether configured for detection of an array or other sample, one ormore microfluorometers that are present in a detection apparatus can beconfigured for wide-field detection. The field diameter for anindividual microfluorometer can be, for example, at least 0.5 mm, 1 mm,2 mm, 3 mm, 4 mm, 5 mm or larger. By choice of appropriate opticalcomponents the field diameter can be limited to a maximum area as welland, as such the field diameter can be, for example, no larger than 5mm, 4 mm, 3 mm, 2 mm or 1 mm. Accordingly, in some embodiments an imageobtained by an individual microfluorometer can have an area that is in arange of 0.25 mm² to 25 mm².

In addition to being configured for wide-field detection, amicrofluorometer can be configured to have a numerical aperture (NA)that is greater than 0.2. For example, the NA of an objective used in amicrofluorometer of the present disclosure can be at least 0.2, 0.3,0.4, or 0.5. Alternatively or additionally, it may be desirable torestrict the NA of the objective to be no greater than 0.8, 0.7, 0.6 or0.5. The methods and apparatus set forth herein are particularly usefulwhen detection occurs through an objective having a NA between 0.2 and0.5.

In array detection embodiments, a detection apparatus (or individualmicrofluorometer) can be configured to obtain a digital image of thearray. Typically, each pixel of the digital detection apparatus (orindividual microfluorometer) will collect signal from no more than asingle feature in any given image acquisition. This configurationminimizes unwanted ‘cross talk’ between features in the image. Thenumber of pixels that detect signal from each feature can be adjustedbased on the size and shape of the features imaged and based on theconfiguration of the digital detection apparatus (or individualmicrofluorometer). For example, each feature can be detected in a givenimage by no more than about 16 pixels, 9 pixels, 4 pixels, or 1 pixel.In particular embodiments, each image can utilize on average 6.5 pixelsper feature, 4.7 pixels per feature or 1 pixel per feature. The numberof pixels used per feature can be reduced, for example, by reducingvariability in the position of features in the pattern of the array andtightening the tolerance for alignment of the detection apparatus to thearray. Taking as an example a digital detector that is configured to usefewer than 4 pixels per feature, image quality can be improved by usingan array of ordered nucleic acid features in place of an array ofrandomly distributed nucleic acid clusters.

It will be understood that a detection apparatus having multiplemicrofluorometers can detect an area of a common plane that is roughlyequivalent to the number of microfluorometers multiplied by thewide-field area detected by each microfluorometer. The areas need not becontiguous. For example, 2 or more microfluorometers can be positionedto detect discrete regions of a common plane that are separated by anundetected area. However, if desired, multiple microfluorometers can bepositioned to detect areas that are contiguous, but not overlapping. Inalternative embodiments a detection apparatus having multiplemicrofluorometers can detect an area of a common plane that issubstantially less than the number of microfluorometers multiplied bythe wide-field area detected by each microfluorometer. This can result,for example, when multiple microfluorometers are positioned to detectareas that have at least a partial overlap. As set forth in furtherdetail elsewhere herein, multiple images need not be acquired in aformat that is used for or that even supports reconstruction of acomplete image of an array or other common plane that has been detected.

An exemplary optical layout for a microfluorometer 100 is shown inFIG. 1. The microfluorometer 100 is directed to a flow cell 170 havingan upper layer 171 and a lower layer 173 that are separated by a fluidfilled channel 175. In the configuration shown, the upper layer 171 isoptically transparent and the microfluorometer 100 is focused to an area176 on the inner surface 172 of the upper layer 171. In an alternativeconfiguration the microfluorometer 100 can be focused on the innersurface 174 of the lower layer 173. One or both of the surfaces caninclude array features that are to be detected by the microfluorometer100. An inspection apparatus can be used in place of flow cell 170.

The microfluorometer 100 includes an objective 101 that is configured todirect excitation radiation from a radiation source 102 to the flow cell170 and to direct emission from the flow cell 170 to a detector 108. Inthe exemplary layout, excitation radiation from the radiation source 102passes through a lens 105 then though a beam splitter 106 and thenthrough the objective on its way to the flow cell 170. In the embodimentshown the radiation source includes two light emitting diodes (LEDs) 103and 104, which produce radiation at different wavelengths from eachother. For example, a green LED (LEDG) and a red LED (LEDR) can be used.The emission radiation from the flow cell 170 is captured by theobjective 101 and is reflected by the beam splitter through conditioningoptics 107 and to the detector 108 (e.g. a CMOS sensor). The beamsplitter 106 functions to direct the emission radiation in a directionthat is orthogonal to the path of the excitation radiation. The positionof the objective can be moved in the z dimension to alter focus of themicrofluorometer. The microfluorometer 100 can be moved back and forthin the y direction to capture images of several areas of the innersurface 172 of the upper layer 171 of the flow cell 170. Again, aninspection apparatus can be used in place of flow cell 170.

As demonstrated by the exemplary embodiment of FIG. 1, each of themicrofluorometers can include a beam splitter and a detector, whereinthe beam splitter is positioned to direct excitation radiation from anexcitation radiation source to the objective and to direct emissionradiation from the objective to the detector. As shown in the figures,each microfluorometer can optionally include an excitation radiationsource such as an LED. In this case, each microfluorometer can include adedicated radiation source, such that the read head includes severalradiation sources each separated into individual microfluorometers. Insome embodiments, two or more microfluorometers can receive excitationradiation from a common radiation source. As such the two or moremicrofluorometers can share a radiation source. In an exemplaryconfiguration, a single radiation source can direct radiation to a beamsplitter that is positioned to separate the excitation radiation intotwo or more beams and directs the beams to two or more respectivemicrofluorometers. Additionally or alternatively, excitation radiationcan be directed from a radiation source to one, two or moremicrofluorometers via one or more optical fibers.

It will be understood that the particular components shown in thefigures are exemplary and can be replaced with components of similarfunction. For example, any of a variety of radiation sources can be usedinstead of an LED. Particularly useful radiation sources are arc lamps,lasers, semiconductor light sources (SLSs), or laser diodes. LEDs can bepurchased, for example, from Luminus (Billerica, Mass.). Similarly, avariety of detectors are useful including, but not limited to acharge-coupled device (CCD) sensor; photomultiplier tubes (PMT's); orcomplementary metal-oxide-semiconductor (CMOS) sensor. A particularlyuseful detector is a 5-megapixel CMOS sensor (MT9P031) available fromAptina Imaging (San Jose, Calif.).

A perspective view of a read head 1000 having an arrangement of eightmicrofluorometers is shown in FIG. 2. Each microfluorometer has acompact design. For ease of demonstration the components of only one ofthe microfluorometers are labeled in FIG. 2 and will be described here.However, as visible in FIG. 2, each of the microfluorometers has similarcomponents and configuration. Two excitation sources are present in eachmicrofluorometer, including a green LED 1040 and a red LED 1030.Excitation light from the LEDs passes through a green LED collector lens1075 and red LED collector lens 1076, respectively. An LED fold mirror1074 reflects the green excitation radiation to a combiner dichroic 1073which reflects the green excitation radiation through a laser diode beamsplitter 1072, then through an excitation projection lens 1071 to anexcitation/emission dichroic 1060 which reflects the green excitationradiation through an objective 1010. The red excitation radiation passesfrom the red LED collector lens 1076 to the combiner dichroic 1073 afterwhich the red excitation radiation follows the same path as the greenexcitation radiation. The objective 1010 is positioned to collectemission radiation and direct it through excitation/emission dichroic1060 which passes the emission radiation to the CMOS image sensor 1080.A laser diode 1301 is positioned to direct radiation via a laser diodecoupling lens group 1401 to laser diode beam splitter 1072 whichreflects the laser diode radiation through the excitation projectionlens 1071, the excitation/emission dichroic 1060, and the objective1010. An autofocus module 1600 is coupled to at least part of theobjective 1010 and configured to translate the objective 1010 up anddown (i.e. along the z dimension). The autofocus module can but need notinclude components of the autofocus apparatus exemplified previouslyherein. It will be understood that additional optical components can bepresent in read head 1000 including, but not limited to thoseexemplified for FIG. 1. Furthermore, certain optical components can beabsent from read head 1000 or modified in read head 1000 to suitparticular applications. Printed circuit boards 1701 and 1702 can beconfigured to communicate with the detectors, autofocus modules and/orexcitation sources.

As demonstrated by the exemplary embodiments above, a read head caninclude a plurality of objectives, each objective being dedicated to asingle microfluorometer. Thus, a microfluorometer of the presentdisclosure can include a variety of optical components, such as one ormore detectors, excitation radiation sources, beam splitters lenses,mirrors, or the like, that form an optical train that directs excitationradiation through a single objective and/or that receives emissionradiation through a single objective. In such embodiments, the objectivecan be configured as a macro-lens having a wide field of view. Inalternative embodiments, a microfluorometer of the present disclosurecan include a variety of optical components that directs excitationradiation through several objectives and/or that receives emissionradiation through several objectives. Thus, an individualmicrofluorometer can include several optical trains that include severalobjectives. In embodiments that include several objectives permicrofluorometer, the objectives can optionally be configured as anarray of micro-lenses. Each objective among several in a particularmicrofluorometer (e.g. each micro-lens in an array of micro-lenses) canoptionally be configured for independent focusing, whereby eachobjective can be moved in the z dimension independent of otherobjectives in the same microfluorometer. Alternatively or additionally,the several objectives can be configured for global focus such that theycan all be moved together in the z dimension.

It will be understood that the various components of a read head thatare set forth herein can be mixed and matched in various ways to achievesimilar function to those exemplified herein. For example, as set forthin the previous paragraph, a read head can include several objectivesand each of those objectives can be dedicated to a singlemicrofluorometer or, alternatively, several of those objectives can beshared by a single microfluorometer. Similarly, and as set forthpreviously herein, each microfluorometer can include at least onededicated excitation source or, alternatively, two or moremicrofluorometers can receive excitation radiation from a sharedradiation source. Thus, there need not be a one to one correspondencebetween the number of microfluorometers in a particular read head andthe number of components exemplified herein for any microfluorometerembodiment. Instead, one or more of the components exemplified herein asbeing useful in a microfluorometer can be shared by severalmicrofluorometers in a particular read head.

A read head of the present disclosure is particularly useful forscanning methods and apparatus, for example, due to its relativelycompact size and low mass which provides low inertia. Reduced inertiaallows the read head to come to rest more quickly following movement,thereby allowing high resolution images to be obtained more rapidly thanwould be the case for a higher inertia read head for which residualmovement of the read head would cause blurring and loss of resolution.Configurations for achieving movement of the read head will be set forthin further detail below. However, first it should be noted that theadvantage of low inertia, is not intended to be a limitation orrequirement for an apparatus or method set forth herein. Rather, a readhead of the present disclosure can be maintained in a static positionfor all or part of a detection protocol. For example, a sequencingmethod, such as those using the fluidic and imaging steps set forthherein, can be carried out using a read head that is static during atleast one and perhaps all of the cycles of the sequencing method.Similarly, the read head can be static during one or more steps of aninspection method set forth herein.

As a first example of a static read head embodiment, a read head caninclude a sufficient number of microfluorometers to detect or image adesired portion of a surface or other object. Thus, the read head neednot move in the x or y dimensions. For example, severalmicrofluorometers can be linearly arranged to capture image frames alongthe full length (or at least along the effective target length) of aflow cell channel or inspection apparatus channel. Similarly, using anappropriate packing arrangement of several rows of microfluorometers,such as those set forth herein, several flow cell channels (present inone or more flow cell), or several inspection apparatus channels, can beimaged along their full length (or at least along the effective targetlength). As set forth below herein, the image frames obtained for anindividual channel can be, but need not be, contiguous.

As a second example of a static read head embodiment, a read head canremain at a fixed position with respect to the x and y dimensions whilea substrate that is being detected by the read head is translated in thex and or y dimension. For example, an apparatus can be provided having atranslation stage that is configured to present a substrate to the readhead. The translation stage can move in a step-and-shoot or continuousmotion to allow scanning of the substrate by the static read head. Inparticular embodiments, the substrate is a flow cell that can be affixedto the translation stage. Alternatively, the substrate can be aninspection apparatus.

In accordance with the above examples, relative motion between a scanhead (or microfluorometer) and a substrate can be achieved by physicalmovement of the scan head (or microfluorometer), physical movement ofthe substrate, or physical movement of both. It will be understood thatthe static read heads referred to in the first and second exemplaryembodiments above need not be static with respect to movement in the zdimension. Rather the static read heads can include one or moremicrofluorometers having autofocus modules. Alternatively oradditionally, the read heads can be moved as a whole in the z dimension,for example, to achieve global focus at least to a rough approximation.

Returning now to embodiments wherein a read head is translated, FIG. 3and FIG. 4 show top and bottom views, respectively, of an exemplary ytranslation stage 200 for a read head. In this exemplary embodiment, they stage is configured for translation in the y dimension but not in thex dimension. Thus, a read head carried by y translation stage 200 willbe capable of movement in the y dimension and the read head orindividual microfluorometers therein may be capable of movement in the zdimension (e.g. via autofocusing), but the read head will not be capableof movement in the x dimension. A read head can be affixed to carriage201 having a base area 241 positioned to support the bottom side of theread head and a frame 240 configured to restrain the read head from sideto side motion. The carriage 201 further includes a flange guide 243 anda collar guide 242. An opening 244 in base area 241 provides a windowbetween a read head and substrate to be detected by the read head. Theaforementioned components of the carriage 201 can form a monolithicstructure.

The carriage is configured to move along a y stage frame 207 via a firstshaft 203, along which the collar guide 242 runs and a second shaft 204along which the flange guide 243 runs. The shafts are oriented along they axis such that the carriage 201 is directed to slide back and forthalong the y dimension via the guides. The first shaft 203 is held to they stage frame 207 by insertion into datum 215 in a first side wall 250and into datum 218 in a second sidewall 251. The first shaft 203 isclamped into datum 215 by support member 252 and clamped into datum 218by support member 253. The second shaft 204 is held to the y stage frame207 by insertion into datum 214 in a first side wall 250 and into datum217 in a second sidewall 251. The first shaft 204 is clamped into datum214 by shaft clamp 206 and clamped into datum 217 by shaft clamp 205.

Movement of carriage 201 is driven by rotation of lead screw 202 whichis threaded through a lead nut 260 and which is affixed to the y stageframe 207 by insertion into a datum on the first side wall 250 and intoa datum 219 in the second sidewall 251. The lead screw 202 is clamped inplace by the same support members 252 and 253 that clamp the first shaft203. The rotation of lead screw 202 is driven by motor 212 which ismounted to support member 252. An encoder 208 is configured to interactwith the motor 212 via a belt 210 that interacts with rotor 209 on theencoder and rotor 211 on the motor 212. A belt tensioner 220 interactswith the belt 210.

An opening 230 passes through the floor 216 of y stage frame 207. Theopening 230 is positioned to accommodate the trajectory of opening 244in the base area 241 of the carriage 201 as it traverses the y stageframe. A read head is positioned in the carriage such that theobjectives are directed through opening 244 and through opening 230along a trajectory traversed by the carriage. Accordingly, the opening230 accommodates imaging of an elongated area along the y axis viamovement of a read head affixed to the carriage.

The structural and functional relationship between y translation stage200 and read head 1000 is shown in FIG. 5. Alternative arrangements ofmicrofluorometers, for example as set forth in US Pat. App. Pub. No.2013/0260372 A1, can also be useful in combination with the inspectionapparatus and inspection methods set forth herein.

A microfluorometer, or read head having several microfluorometers, canbe positioned above a flow cell or inspection apparatus (with respect togravity's arrow) as exemplified for several embodiments set forthherein. However, it is also possible to position a microfluorometer, ora read head, underneath a flow cell or inspection apparatus. Accordinglya flow cell or inspection apparatus can be transparent on the top side,bottom side or both sides with respect to the wavelengths of excitationand emission radiation used. Indeed, in some embodiments it may bedesirable to position microfluorometers on both sides of a flow cell orinspection apparatus, or alternatively, to position read heads on bothsides of a flow cell or inspection apparatus. Other orientations withrespect to gravity are also possible, including for example a side toside orientation between a flow cell and microfluorometer (or readhead).

A microfluorometer or read head can be configured to detect the twoopposing, inner surfaces of a flow cell (or inspection apparatus) from asingle side of the flow cell (or inspection apparatus). For example, themicrofluorometer or read head can employ an optical compensator that isinserted and removed to detect alternative surfaces of the flow cell orinspection apparatus. Exemplary methods and apparatus for detectingopposing inner surfaces of a channel such as the use of opticalcompensators are described in U.S. Pat. No. 8,039,817, which isincorporated herein by reference in its entirety. A compensator isoptional, for example, depending upon the NA and/or optical resolutionof the apparatus.

A microfluorometer used in an apparatus or method set forth herein caninclude an autofocus module. Accordingly, multiple microfluorometersthat are present in a read head can each have a dedicated autofocusmodule. An autofocus module that is used in a microfluorometer caninclude a detector and an actuator, wherein the actuator is configuredto alter the focus of the microfluorometer with respect to the commonplane, and wherein the detector is configured to direct movement of theactuator. As such an autofocus module can include a dedicated detectorthat directs movement of the actuator. The dedicated detector canoperate in a closed loop with the actuator without a need to communicatedata outside of the microfluorometer or outside of the detection head inorder to achieve automatic focusing. Alternatively or additionally, adetector outside of the autofocus module, such as the imaging detectorthat is used for wide-field imaging, can direct movement of theactuator. Thus, the same detector that is used for wide-field imagingand for outputting image data to a processing unit outside of themicrofluorometer or read head can also be used to achieve automaticfocusing.

In particular embodiments, autofocus modules for two or moremicrofluorometers in a read head can be configured to communicate witheach other. For example, an autofocus module for a firstmicrofluorometer of a read head can be configured to integrate data froman autofocus module for a second microfluorometer of the apparatus. Inthis way the autofocus module for the first microfluorometer can alterthe focus of the first microfluorometer based on the perceived focusposition of the first microfluorometer and the perceived focus positionof the second microfluorometer. Thus, a detector for an autofocus modulecan be configured in a way that it is dedicated to focusing generallyacross a read head while not being configured for analytical imageacquisition. Information from two different autofocus modules can beuseful in determining tip-tilt of the read head. Undesirable tip-tiltcan be corrected by compensatory actuation of one or moremicrofluorometers based on the tip-tilt information.

A read head can include two or more microfluorometers, for example,attached to a carriage. For embodiments that utilize a multichannel flowcell (or inspection apparatus), the read head can include a number ofmicrofluorometers that correspond to the number of channels in the flowcell (or inspection apparatus). More than one microfluorometer perchannel can be present. In particular embodiments, a read head canprovide a single microfluorometer channel. In the exemplary arrangementshown in FIG. 6A, the flow cell has four channels and the read head hasfour microfluorometers. The figure shows a top plan view of the flowcell and objectives of the microfluorometers. For ease of demonstrationcomponents of the microfluorometers other than the objectives are notshown; however, those components can be positioned to achieve a compactdesign, for example, along the lines exemplified elsewhere herein. Asshown in FIG. 6A, the four objectives can be arranged in a linearrelationship such that the objectives are closely packed and animaginary straight line passes through the center point of eachobjective. The imaginary line can be offset at an angle with respect tothe y dimension, the y dimension corresponding to the longest dimensionof the flow cell (or direction of scan). The angle can be between 0° and90° in the x-y quadrant and can be selected to accommodate the spacingof the channels in the flow cell (and the spacing of the objectives inthe read head). FIG. 6A shows a relatively low angle of offset for aline passing through closely packed objectives which accommodatesrelatively closely packed channels. A higher angle of offset can be usedto accommodate channels that are separated by greater distances fromeach other or objectives that are less closely packed.

FIG. 6B shows an arrangement of multiple objectives in two lines. Herethe flow cell includes eight channels and the read head has eightmicrofluorometers. The overall packing of the objectives in the twolines is approximately rectilinear. The arrangement accommodates closelypacked objectives and two sets of closely packed channels (i.e. a firstset of four closely packed channels and a second set of four closelypacked channels). In this example, the two sets of closely packedchannels are separated by a larger spacing than the spacing thatseparates individual channels in each set of four. It will be understoodthat the overall packing of the objectives in the two lines can beoffset from rectilinear to accommodate different channel arrangements.Furthermore, as set forth in regard to a single line of objectives, theoffset angle of the imaginary line running through the centers of bothlines of objectives can be altered and/or the distance betweenobjectives can be altered to accommodate different channel arrangements.

As demonstrated by the examples above, each objective in a read head canbe positioned to image at least a portion of an individual channel (of aflow cell or inspection apparatus). Each objective can be positioned toimage one and only one channel of a flow cell or inspection apparatushaving several channels. An individual objective can be positioned toimage a portion of one and only one channel, for example, when locatedat a particular y-stage position. Scanning in the y dimension can allowall or part of the channel to be imaged through the objective. In somecases, for example when the field diameter of the objective (or otherlimiting optical components of a microfluorometer) is less than thewidth of the channel, the objective can also be scanned in the xdimension to image all or part of the channel. Multiple objectives andtheir respective microfluorometers can be positioned such that severalof the objectives are positioned to each obtain images for at least aportion of one and only one channel. Of course movement of a read headcontaining the multiple objectives and their respectivemicrofluorometers can occur in the y and/or x direction to image all orpart of each respective channel. These particular configurations areuseful for multichannel flow cells or multichannel inspection apparatus.However, it will be understood that the configurations and underlyingprinciples set forth above can be applied to an appropriate arrangementof several individual flow cells or inspection apparatus, each havingonly a single channel. Furthermore, as is the case generally for themethods and apparatus set forth herein, the arrangements can be appliedto substrates other than flow cells and inspection apparatus.

As exemplified above a carriage can be configured to move a read head,for example, in a scanning operation. Alternatively or additionally, acarriage can be configured to prevent relative movement betweenindividual microfluorometers of a read head in the x and y dimensions. Acarriage need not provide this function, for example if the read headincludes other structure elements that prevent relative transversemotion between individual microfluorometers, For example, a read headmay be formed from a co-molded assembly (e.g. a monolithic assembly).The co-molded assembly can in turn be affixed to a carriage.Nevertheless, in some embodiments, the carriage may play at least anauxiliary role in preventing relative transverse motion betweenindividual microfluorometers of a read head. Furthermore it will beunderstood that a read head that is formed from a co-molded assembly canbe used for embodiments that do not employ a carriage.

A y stage that is used in a method or apparatus set forth herein can beconfigured to scan via a discontinuous or continuous motion.Discontinuous scanning, often referred to as step-and-shoot scanning,generally involves incremental movement of a microfluorometer or scanhead in the y (or x) direction and detection (e.g. image acquisition)between movements, while the microfluorometer or scan head is in atemporarily static state. Continuous scanning on the other handgenerally involves detection or image acquisition while themicrofluorometer or scan head is moving. In a particular embodimentcontinuous scanning can be carried out in time delay integration (TDI)mode. Accordingly, signal obtained by pixel elements along the scandimension can be collected in a common bin and read out as a singlevalue. TDI mode can provide advantages of increased signal processingrate and increased accuracy. Exemplary optical arrangements that can beincluded in a microfluorometer or read head to accommodate TDI modedetection are described, for example, in U.S. Pat. No. 7,329,860, whichis incorporated herein by reference.

A readout printed circuit board (PCB) can be present in a read head(see, for example, PCB 1701 and 1702 in FIG. 2) and can be connected toa main PCB that is typically contained within the detection apparatushousing. In alternative embodiments the main PCB can be located exteriorto the instrument. Data can be communicated to and from the readout PCBand/or main PCB as set forth in US Pat. App. Pub. No. 2013/0260372 A1.In particular embodiments, the main PCB can also be connected to anexterior primary analysis personal computer (PC). In some embodimentsthe primary analysis computer can be located within the housing of thedetection apparatus. However, placing the primary analysis computeroff-instrument allows for interchangeable use of a variety of computersto be used for different applications, convenient maintenance of theprimary analysis computer by replacement without having to interrupt theactivity of the detection apparatus and small footprint for thedetection apparatus. Any of a variety of computers, can be usedincluding, for example, a desktop computer, laptop computer, or servercontaining a processor in operational communication with accessiblememory and instructions for implementation of the computer implementedmethods described herein. The main PCB can also be connected to a userinterface.

Other imaging modules that can be evaluated using an inspectionapparatus of the present disclosure include, but are not limited to,those in a HiSeq® platform, MiSeq® platform, HiScan® platform or thoseset forth in PCT Pub. No. WO 07/123744; US Pat App. Pub. Nos.2012/0270305 A1; 2013/0023422 A1; and 2013/0260372 A1; and U.S. Pat.Nos. 5,528,050; 5,719,391; 8,158,926 and 8,241,573, each of which isincorporated herein by reference

Apparatus for Alignment and Validation of an Imaging Module

The following description and related drawings set forth one or moreembodiments of inspection apparatus and methods. In some embodiments,the inspection apparatus can be used for alignment or validation of theimaging modules exemplified above. Furthermore, the inspection methodscan be carried out for validation and alignment of the exemplifiedimaging modules or optical components thereof. It will be understood,that various modifications may be made to the inspection apparatus,inspection methods and/or the imaging modules that they are used with.One or more of the optical characteristics of an imaging apparatus,including but not limited to those set forth above, can be evaluatedusing an inspection apparatus or method set forth herein. Furthermore,an inspection apparatus can be used in combination with an analyticalsubstrate (e.g. a flow cell). In some embodiments, methods can becarried out to include steps of an inspection method and steps of ananalytical method (e.g. a nucleic acid sequencing method).

An exemplary inspection apparatus is referred to herein as “Ubertargetapparatus”. The Ubertarget apparatus is an optical alignment tool thatcan be used for sequencer Imaging Module tests. The composition,manufacture and use of the Ubertarget apparatus exemplified below can beextended to other inspection devices as well.

In some embodiments, the Ubertarget apparatus can be used (1) in afully-integrated nucleic acid sequencer system (such as a NextSeq®sequencer system (Illumina, Inc., San Diego)), (2) at any point in themanufacture process of a sequencer after the imaging module (IM) isinstalled, (3) as a field service tool for installation or service of asequencer system, (4) in quality control fixtures for evaluatingmanufacture of various components of the NextSeq® sequencer or (5) in astand-alone camera module test station.

The Ubertarget apparatus, for example, when used to align or validate asequencer, can be illuminated with a light source that is part of thesequencer, such as a green and/or red LED in the camera modules (alsoreferred to as “microfluorometers”) of a NextSeq® sequencer system(Illumina, Inc., San Diego). In this example, the LED illumination willexcite a fluorescing dye in the Ubertarget apparatus. It is alsopossible to use a light source that is extrinsic to the sequencer, suchas a backlight that is positioned to shine up through the Ubertargetapparatus when the Ubertarget apparatus is located in the sequencerinstrument.

Diagrams of the Ubertarget apparatus 70 are shown in FIG. 7A and FIG.7B. As shown in the top view of FIG. 7A, the Ubertarget apparatus 70,which is designed for use in a NextSeq® Sequencer, has dimensions (100mm×40 mm) that are similar to the flow cell used in the sequencer. Thus,the Ubertarget apparatus 70 can be readily positioned on the stage ofthe sequencer for alignment and validation procedures. The fluidicchannel 73 of the Ubertarget apparatus 70 has overall dimensions thatare similar those of the channels in the flow cell. As demonstrated bythis example, it is beneficial for an inspection apparatus (e.g.Ubertarget apparatus) to have lanes located at the same relativeposition as the channels of an analytical apparatus (e.g. flow cell)that are optically addressed by the imaging module (e.g. NextSeq®Sequencer) during use of the analytical apparatus. Of course smalldifferences in channel size and shape can be accommodated, and need notresult in significant reduction in the diagnostic capability of theinspection apparatus. For example, as set forth in further detail below,the portion of the Ubertarget channel 75 having fluid entry and exitports differs from the portion of the flow cell that has entry and exitports. However, these differences do not directly impact the ability ofthe Ubertarget apparatus to be used for alignment and validation of theNextSeq® Sequencer optical components along the entirety of the detectedportion of the flow cell because the inlet and outlet regions are notaddressed by the imaging module of the NextSeq® Sequencer. TheUbertarget apparatus can also include identifying indicia such as aserial number, part number or barcode.

As evident from the side view of the Ubertarget apparatus 70 in FIG. 7B,the thickness of the top glass 71 (700 μm+/−10 μm) and bottom glass 72(800 μm+/−15 μm) is similar to the respective thickness of these sidesof the NextSeq® flow cell. The thickness of the channel opening 73 inthe z dimension (100 μm+/−10 μm) is also similar to that found in theflow cell. Generally, it is beneficial for the dimensions of aninspection apparatus, through which optical inspection occurs, to besimilar to those dimensions of the analytical apparatus through whichanalytical detection occurs. However, if desired or necessary, thedimensions of one or more of these components can differ between theinspection apparatus and relevant analytical apparatus. In this case,theoretical or a priori parameters can be used to correlate measuresobtained from the inspection apparatus and analytical apparatus. TheUbertarget apparatus can also include at least one tile having a patternof metal pads (e.g. 50 nm thick chrome pads) on the bottom side of thetop glass. The metal pads can be used for optical analysis as set forthin further detail below.

The entirety of an inspection apparatus' inner surface can contain metalpads. However, the entire surface need not contain pads. Rather one ormore tiles (or other portions) on the surface that is to be imaged canlack metal pads. Tiles with no metal pads provide a uniform light acrossthe field of view that enable fixed pattern noise calibration or flatfield correction, for example, using methods exemplified for anUbertarget apparatus and NextSeq® sequencer herein below. Suchcorrections can be determined for several excitation sourcesindividually. Alternatively or additionally, one or more portions of aninspection apparatus' inner surface can contain a fiducial.

An inspection method can use a back illumination of an inspectionapparatus as diagrammed in FIG. 8. In the example the Ubertargetapparatus is placed on the flow cell holder of a NextSeq® imaging moduleand an external backlight illuminates the underside of the Ubertargetapparatus. White light from a lamp can be used. The light passes throughthe lower glass, through the channel opening and to the lower surface ofthe upper glass. At this surface the light will either be blocked by themetal pads or it will transmit through the upper glass to the cameramodule of the instrument that is under analysis. The metal pads appearas dark shadows in a field of light detected by the camera. The opticalcomponents can be focused on the metal pads and accuracy of focus can bedetermined from the sharpness of the shadows produced by the pads.

An alternative inspection method is diagrammed in FIG. 9 where an LED ofthe NextSeq® imaging module is used instead of an external backlight. Inthis case, the channel opening of the Ubertarget apparatus is filledwith a fluorescent dye that is excited by the LED to produce afluorescent emission. The channel opening can be filled with a mixtureof more than one fluorescent dye. For example, the Ubertarget apparatuscan be filled with a first dye that is excited by a red LED and a seconddye that is excited by a green LED. This will allow both the red andgreen channels of the NextSeq® imaging module to be evaluated. As shownby the diagram of FIG. 9, the Ubertaget can be placed forepifluorescence detection such that excitation light impinges on the topside of the top glass and transmits to the lower surface of the topglass. LED light can pass into the channel opening to excite thefluorescent dye but LED light that hits the metal pads is prevented fromexciting dye. Emission from the dye passes back through the upper glassand to the camera where it is detected. Again, the resulting image willappear as a pattern of shadows cast by the metal pads in a field offluorescent emission light. The optical components can be focused on themetal pads and focus can be determined from the sharpness of the shadowsproduced by the pads.

In particular embodiments, the Ubertarget apparatus can be filled withRhodamine 590 dye and Oxazine 750 dye. The Rhodamine 590 dye can beexcited by the green LED at 532 nm and emission can be collected througha 550-610 nm bandpass filter. The Oxazine 750 dye can be excited by thered LED at 660 nm and emission can be collected through a 695-730 nmbandpass filter. These conditions were found to separate red and greenemission signals with no appreciable cross talk.

Dye material can be introduced to an Ubertarget channel as follows.Glycol is flushed through the channel of the Ubertarget apparatus toclean out the channel. The volume of glycol flushed through is 25 mLwhich is 100 times the volume of the channel. The glycol is pumped at arate of 150 μL/min. Dye solution is then pumped into the lane. The dyesolution contains 1.46 μg Exciton Rhodamine 590 (Green Dye) per mL ofglycol and 13 μg Exciton Oxazine 750 (Red dye) per mL of glycol. Avolume of 1.25 mL of the dye mix is pumped at a rate of 150 μL/min. Thechannel openings are then sealed and the Ubertarget apparatus is readyfor use after the sealant has cured for 24 hours. A useful sealant iswhite silicone (kitchen and bath) from DAP (Baltimore, Md.).

The mixture of Rhodamine 590 and Oxazine 750 was found to be veryphotostable. Photobleaching experiments showed that an Ubertargetapparatus used to qualify imaging modules experiences only a 3% drop inthe fluorescence of the red and green dyes. Each Imaging Modulequalification consisted of: (1) acquiring 300 images of the open lane ineach color for Flat Field Correction and Fixed Pattern Noise, (2)acquiring 90 images of the fiducials for determining best-focus downlanes, (3) acquiring 120 images of the fiducials for XY position testsof the XY stage and (4) acquiring 30 images of the image quality tilefor optical alignment measurements. The dyes are able to diffusethroughout the channel so that there is no localized bleaching. Thus,when multiple cameras are used, each of the cameras is expected to viewthe same apparent intensity of dye. Accordingly, the dye solution in theUbertarget apparatus provides a useful tool to measure the relative LEDpower at each region of the detection field combined with emissiontransmission efficiency. The relatively high photostability of the dyescan also allow for LED calibration using the Ubertarget apparatus.

The mixture of Rhodamine 590 and Oxazine 750 was found to be very heatstable. Zero degradation in intensity of the dyes was observed afterbaking at 65 degrees C. for 5 days. Heat stability of the dyes indicatedthat the Ubertarget apparatus is robust through the course of imagingmodule optical alignment measurements at normal operating temperatureconditions for a NextSeq® sequencer (60 degrees at the flowcell holder).

Although Rhodamine 590 and Oxazine 720 provide particular advantages,other fluorescent species can be used. Examples of useful fluorescentspecies include those having the following moieties: umbelliferone,fluorescein, fluorescein isothiocyanate, rhodamine, tetramethylrhodamine, eosin, green fluorescent protein, erythrosin, coumarin,methyl coumarin, pyrene, malachite green, stilbene, lucifer yellow,Cascade Blue™, Texas Red™ dichlorotriazinylamine fluorescein, dansylchloride, phycoerythrin, fluorescent lanthanide complexes such as thoseincluding Europium and Terbium, Cy3, Cy5, nanocrystals, as well asothers known in the art as described, for example, in Principles ofFluorescence Spectroscopy, Joseph R. Lakowicz (Editor), Plenum Pub Corp,2nd edition (July 1999) and the 6th Edition of the Molecular ProbesHandbook by Richard P. Hoagland. Luminescent materials can also beuseful such as luminal.

FIG. 10 shows fiducial images obtained from a NextSeq® imaging modulefocused above the metal layer of an Ubertarget apparatus (Panel A), atthe metal layer (Panel B) and below the metal layer (Panel C). Asdemonstrated by the images the metal regions appear dark and thefiducial areas with no metal appear white (e.g. shaped like a “+” in theimages). The edges of the metal appear sharp in Panel B due to thecamera being in focus with the pads as opposed to the blurry edges ofthe metal in Panels A and C where the camera is out of focus. The “+”shaped object is relatively large which provides the advantage ofallowing it to be visible even when it is far out of focus.

FIG. 11 shows photographs of an Ubertarget 1101 in a quality controlfixture 1102 (Panel A) and in a cartridge 1103 fitted for a NextSeq®sequencer (Panel B). The cartridge 1103 has the same dimensions as acartridge used for a NextSeq® flow cell. The cartridge 1103 includescontact points 1104 a, 1104 b and 1104 c for z-reference datum pins onthe underside of the xy stage of the NextSeq® sequencer. This providesmechanical reference for z, theta-x and theta-y coordinates. Ubertarget1101 floats in cartridge 1103, but once cartridge 1103 is placed on theheater plate of the NextSeq® sequencer, 3 dowel pins pass throughopenings 1105 a, 1105 b and 1105 c and contact the edge of Ubertarget1101 to seat Ubertarget 1101 on the imaging module. This providesmechanical reference for x, y and theta z.

The present disclosure provides an inspection apparatus that avoidsproblems of channel dryout and bubble formation. As exemplified above,the Ubertarget apparatus uses glycol which does not make bubbles easily.Other high viscosity solvents can produce this advantage as well. Inaddition to high viscosity it can be beneficial to use a solvent havinga high boiling point. For example, glycol in addition to being highlyviscous has a high boiling point (190° C.) which minimizes evaporationat the temperatures at which the Ubertarget apparatus is stored,transported and used. Furthermore, channel sealing can be achieved usinga highly compliant silicone RTV (room temperature vulcanization)injected into the ingress and egress ports of the channel. Silicone isparticularly useful because it is compatible with the Ubertargetapparatus: (1) resulting in less than 250 nm of glass deformation uponcuring, (2) resisting degradation when submerged in glycol (e.g. forover 1 month in a shelf life test), (3) being capable of curing to forma seal when in contact with glycol, (4) being inert to dye molecules,and (5) being inexpensive, easy to dispense, and providing a visualindication of seal quality.

In particular embodiments, an inspection apparatus can includestructural elements that minimize or prevent channel dryout and bubbleformation. For example, Ubertarget apparatus 70 contains a sacrificialchannel region as indicated by the diagram of FIG. 12A. On the left isan inspection apparatus 121 having four separate channels 122 a-122 d inthe same footprint as a NextSeq® flow cell. Taking channel 122 d as anexample, inlet 123 is relatively close to the first set of detectiontiles 124. A bubble that starts growing at inlet 123 will encroach upontiles 124 after growing only a few millimeters in diameter. In contrast,Ubertarget apparatus 70 contains an extended sacrificial lane 82 thatforms an ingress lane between the inlet port 80 and the first detectionlane of channel 73. The first detection lane is the relatively wideregion having a footprint and location that correlates with channel 122c of inspection apparatus 121. In the example shown, the sacrificialregion is about 100 mm long such that a bubble forming at inlet 80 wouldneed to expand to a large volume prior to having an adverse impact on aprocedure using Ubertarget apparatus 70. A similar sacrificial regionforms an egress lane between outlet 85 and the fourth detection lane ofchannel 73 (i.e. the lane corresponding to channel 122 b of apparatus121). This prevents bubble encroachment from the other side of thechannel 73. As shown in the diagram, Ubertarget apparatus 70 containsone channel in which wide sections, that correlate with the imagingwindows of channels 122 a-122 d of flow cell 121, are connected in aserpentine fashion. The single channel configuration provides ease offilling the Ubertarget apparatus 70 and uniformity of dye solutionacross all four of the regions that correlate with channels 122 a-122 dof flow cell 121.

An additional structural element of Ubertarget apparatus 70 thatminimizes or prevents channel dryout and bubble formation is thepresence of a pressure relief port 81 near the inlet port 80. Thepressure relief port 81 prevents damage to a seal at inlet port 80 whenthe outlet port 85 is sealed (i.e. damage can occur due to introductionof the seal fluid into the closed system that has been produced due tothe seal at the opposite end of the channel). Damage to the seals can beprevented in Ubertarget apparatus 70 by using the following technique.After filling channel 73 with dye solution, a removable tape or otherseal is placed over outlet port 85 and outlet pressure release port 84.Then sealant is injected into inlet port 80 and allowed to flow untilflowing out of inlet pressure relief port 81. Then the tape or otherremovable seal is placed over inlet port 80 and inlet pressure reliefport 81. Once the inlet is sealed in this way sealant can be injectedinto outlet port 85 and allowed to flow until flowing out of outletpressure relief port 84. In this way the pressure relief ports provide avent to avoid damage to the seal between ports 80 and 81, therebypreventing unwanted bubble formation and drying during later use.

An inspection apparatus need not include pressure relief ports.Furthermore, the channel need not be sealed using a seal fluid (e.g.silicone). For example, in some embodiments there is a single ingressport and a single egress port. The ports can be sealed using a flexibletape such as Kapton tape. The tape has an advantageous property ofacting like a diaphragm, where it maintains a seal, but can expand awayfrom the port or contract into the port depending on the internal lanepressure (e.g. pressure changes typically due to temperature changes).The tape also has the advantage of allowing refilling or manual ventingof the Ubertarget apparatus, for example, if bubbles form in the laneover time.

Unwanted bubble formation can also be avoided by degassing fluids thatare loaded into the Ubertarget apparatus. For example, temperaturechanges may cause bubbles to form in the middle of the lanes. This iscaused by dissolved gas in the fluid coming out of solution and making apermanent bubble. Bubble formation has been avoided by puttingglycol-dye solution in a vacuum chamber and pulling air out of thesolution immediately before pumping the solution into the Ubertargetapparatus.

In particular embodiments, an inspection apparatus will have a highdegree of flatness. It is particularly advantageous to have a highdegree of flatness for surfaces that are to be imaged, such as thesurfaces of the top glass and bottom glass of an Ubertarget apparatusthat face the inside of the channel. An Ubertarget apparatus having aflatness variance of less than 12 μm across the length of the detectionarea is particularly useful. Ubertarget apparatus having a variance of+/−3 μm have been found to be particularly useful.

FIG. 12B shows the location of printed patterns on an Ubertargetapparatus along with the image areas for the 6 cameras of a NextSeq®imaging module. The same pattern is printed for each of the 6 cameras.Various regions of each image area are indicated in the Figure. Forexample, the regions shaded with alternating solid and dashed lines aretransparent, lacking any metal coating (e.g. no chrome); the openregions (unshaded) are also transparent, lacking any metal coating; theregions indicated as Mask F are image quality tiles; and regionsindicated as Mask A include metal patterns (e.g. chrome). FIG. 12Cprovides further detail regarding Mask F and Mask A. Generally Mask Aand Mask F have a chrome layer (on the inner surface of the upper glass)with optional transparent features as follows. Mask F, which is alsoreferred to as an image quality tile, has a grid of 1.0 μm spots spaced15 μm apart in the chrome layer. Mask A includes pattern 1, whichincludes MTF targets at 5 field points; pattern 2, which is an autofocustile having a chrome layer with 5 micron holes at 15 micron spacingoverlaid with a 500 micron square opening in the center; pattern 3,which is an all chrome layer; pattern 4, which is a chrome layer havinga transparent “+” shaped fiducial; and pattern 5, which is a chromelayer having 0.5 micron holes at 15 micron spacing.

An imaging apparatus can include software for running various inspectionmethods. The tests can be ordered by an individual via interaction witha graphical user interface (GUI). The GUI can, for example, include amenu of tests from which a user can select some or all tests. Anexemplary GUI is shown in FIG. 13. In the GUI a user has clicked oncheckbox icons to select four Stage Tests (“Camera XY Position”, “XYRepeatability”, “Z Travel Limits” and “Z-Stage Step and Settle”). Theuser has not selected to run the “Z Offset Down Lane” test. By clickingthe “Run” button the user can initiate the four tests. The tests can berun by the imaging apparatus and results can be returned to the user,for example, in an XML file format. The results of the test report canbe exported to a spreadsheet for further evaluation and analysis.

A system capable of carrying out an inspection method set forth herein,whether integrated with detection capabilities or not, can include asystem controller that is capable of executing a set of instructions toperform one or more steps of a method, technique or process set forthherein. For example, the instructions can direct the performance ofsteps for aligning or validating an optical imaging apparatus. A usefulsystem controller may include any processor-based ormicroprocessor-based system, including systems using microcontrollers,reduced instruction set computers (RISC), application specificintegrated circuits (ASICs), field programmable gate array (FPGAs),logic circuits, and any other circuit or processor capable of executingfunctions described herein. A set of instructions for a systemcontroller may be in the form of a software program. As used herein, theterms “software” and “firmware” can include any computer program storedin memory for execution by a computer, including RAM memory, ROM memory,EPROM memory, EEPROM memory, and non-volatile RAM (NVRAM) memory. Thesoftware may be in various forms such as system software or applicationsoftware. Further, the software may be in the form of a collection ofseparate programs, or a program module within a larger program or aportion of a program module. The software also may include modularprogramming in the form of object-oriented programming Softwarecommercially available from Illumina (San Diego), in particular foroperating the NextSeq® sequencer is particularly useful.

An exemplary automated process flow that can be run on a NextSeq®sequencer and using an Ubertarget apparatus is shown in FIG. 14. Theprocess is initiated in software when the user hits the Run button onthe GUI. The imaging module finds the xy position for a fiducial andsends an xy position offset to firmware. This step is not sensitive toimage brightness or focus. The xy offset information allows the computerto determine the xy location for all features on the Ubertargetapparatus. The detection area is then moved to an open area of theUbertarget apparatus (i.e. an area where there are no metal pads) andcalibrates the LED currents for the proper illumination. This step isnot sensitive to z position. At the next step an image is obtained ofthe open area to determine image uniformity, fixed pattern noise andflat field correction. These determinations are not sensitive to zposition. The process then moves to an image quality tile and imagequality tests are run. At this step the best z position is found using acourse through-focus stack. Then the imaging window moves to anautofocus tile where autofocus tests are run. After this, images aretaken of an area of the Ubertarget apparatus having metal pads andfilter breakthrough tests are run. The xy stage tests are then run.After the tests have been run the results are output to an XML file.

Any of a variety of characteristics of an image module can be evaluatedusing an inspection apparatus of the present disclosure. Severalexamples are set forth below in the context of testing a NextSeq®sequencer with an Ubertarget apparatus. It will be understood thatsimilar tests can be carried out for other analytical systems using adifferent inspection apparatus. Furthermore, details of each test neednot be necessary n all applications as will be evident to those skilledin the art when applying the principles exemplified below to alternativeanalytical systems and inspection apparatus.

In some embodiments, optical alignment can be determined Exemplaryaspects of optical alignment that can be evaluated include, imagequality as judged by D50/FWHM, usable depth of field, usable field ofview, tilt, field curvature, uniformity, chromatism (i.e. axial color),optical distortion, relative camera position, and best focus z position.The D50/FWHM is obtained by imaging features (e.g. the 1.0 micron holeson the image quality tile of an Ubertarget apparatus) and measuring howmany pixels occupy the diameter of each feature in the image. Forinstance, 1 micron holes, when imaged with a relatively high qualitycamera, will appear to be 1.70 pixels in diameter (FWHM) in the image.If the camera's image quality is poorer, then a larger number of pixels(e.g. 2.00 or more pixels) will appear in the diameter of a 1 micronhole in the image. Another aspect of optical alignment that can beevaluated is encoder error in a moveable stage (e.g. in the Y-stage ofthe NextSeq® sequencer).

In some embodiments calibration can be evaluated, for example, todetermine fixed pattern noise, flat field correction or channelcentering. In some embodiments autofocus can be evaluated, for exampleby determining laser spot z position, autofocus gain, laser spot xyposition, laser spot xy separation (when two lasers are used havingseparated excitation spots), laser spot brightness, laser spot identityand autofocus error. Other verification steps that can be evaluatedinclude, for example, image background, effective field of view,magnification, distortion, z offset down the channel, xy skew, imageintensity stability, identification of defective camera pixels, MTFdecay time, repeatability of xy movements and accuracy of xy movements.

An inspection method of the present disclosure can include a routine fordetermining bit error rate. The test sends a known digital patternthrough the entire electrical data path of the NextSeq® imaging modulefrom the sensor to the main board RAM and confirms that the pattern readback from RAM is correct.

Fiducial Finding can also be carried out, for example, as follows. Athrough-focus test is done with 25 micron steps on the xy location wheresoftware expects to see the fiducials at lane 1/3, swath 2, tile 1.Course best-focus Z is obtained from the images. Then xy location of thefiducials is determined and used to offset the Ubertarget tile map suchthat each tile overlays the proper XY coordinate on the Ubertarget beingtested.

An inspection method of the present disclosure can include a routine forsetting excitation source currents for proper image intensity. Theroutine can include sequential steps of positioning the Ubertargetapparatus in a NextSeq® imaging module such that an open area of thechannel (i.e. with no metal pads) is detected, setting the cameraexposure to 1 ms and LED currents to 30%, capturing a dark image with 1ms exposure and no LEDs on, capturing an image in red and green opticalchannels with 1 ms exposure, calculating mean intensity of the images,and adjusting LED currents to hit a desired intensity of 2500 countswith 1 ms exposure. LED currents are kept at these values for theremainder of the tests. All subsequent tests can use different exposuretimes based on the geometry of the metal pad pattern. For example,fiducial tiles and uniformity tiles (lacking metal pads) can be detectedwith a 1 ms exposure, autofocus tiles can be detected with a 4 msexposure, image quality tiles can be detected with a 150 ms exposure,and filter breakthrough tiles (fully coated with metal on the interiorsurface of the upper glass) can be detected with a 500 ms exposure.

An inspection method of the present disclosure can include a routine forexcitation source calibration. The routine can be carried out asfollows. The xy stage of a NextSeq® sequencer is moved to the autofocustile at lane 1/3, swath 3, tile 10 of the Ubertarget. A through-focusstack is generated in red and the best-focus Z height is calculated(step size is 6 microns, exposure time is 4 ms and sweep range is 108microns0. Then the xy stage is moved to the neighboring tile at lane1/3, swath 3, tile 9 to collect all laser images. This is done tomitigate the risk of a manufacturing defect in the Ubertarget apparatuswhere not all the chrome is removed from inside the 500 micron squareopening in the autofocus tile. This defect would make the laser spotintensity too bright at the autofocus tile. The process then collectslaser through-focus images (using standard settings for focus modelgeneration) and the laser spot intensity is checked. The step sizeduring these measurements is 2 microns with a Z range that is +/−18microns. Then the laser exposure time is adjusted until the AF spots are2000+/−200 counts for “brightest spot” (within +/−18 microns of red bestfocus). If “save calibrations” was selected on the user interface, thenthe laser exposure time to use for sequencing is stored.

A further routine that can be included in an inspection method is adetector calibration test. The test can be carried out as follows.Images of an Ubertarget apparatus are obtained on a NextSeq® sequencerat 4 different LED intensities: (1) Dark (LEDs off), (2) Middle lowintensity, (3) Middle high intensity, and (4) Bright intensity (about3000 counts). When taking these images the xy stage is moved betweeneach image. All tiles in lane 2/4, all swaths, and tiles 4-11 are usedto average out any non-uniform fluorescence (due to debris orfingerprints on top of the Ubertarget). Camera corrections are saved ifthat was selected in the GUI. Camera corrections need not be applied toany subsequent tests that were selected.

An inspection method of the present disclosure can include a routine forimage uniformity correction and flat field correction. Images taken on aNextSeq® sequencer over an Ubertarget tile with no metal pads showrelative intensity of the optics across the field of view. For example,fine structure in the illumination for the green LED can be observed ashorizontal bands and for the red LED as an outer bright ring. Suchimages can be used for determining uniformity based on LED positioning,determining fixed pattern noise in the detection device, and determiningflat field correction, for example, by calibrating gain and offset ofevery pixel for each color so that images are equal intensity across thefield of view.

An inspection apparatus can include one or more fiducials in the regionsthat are to be detected. For example, the Ubertarget apparatus 70 inFIG. 15 has several fiducials that appear as “+” shapes. Fiducial 150 ais located at a position that is in the second swath 151 of the firsttile 152. Fiducial 150 b is also located in the second swath 151 but inthe tenth tile 153. The fiducials are arranged with respect tomicrofluorometers in a read head of a NextSeq® imaging module such thateach camera will observe a fiducial at the second swath of tiles 1 and10 in each lane of the channel (i.e. where the lanes correspond to thedetectable regions of the channels in a NextSeq® flow cell). Thefiducial position tolerance is +/−20 μm relative to the reference edgesof the Ubertarget apparatus.

A fiducial tile in an inspection apparatus can be used for a variety ofevaluations including, for example, determining relative camera positionin the x and y dimensions, skew in x and y, and repeatability ofrepositioning in the positive x direction, negative x direction,positive y direction and negative y direction.

The NextSeq® imaging module shows high accuracy and repeatability forfinding fiducials of the Ubertarget apparatus. The fiducials werelocated 10 times with no change in xy stage motion required. The imagingmodule produces sharp images with high contrast. The background (i.e.shadow produced by metal regions 0 produces an average of 190 countswhile the open “+” shaped portion of the fiducial produces 3000 counts.

An inspection method can include an image quality test. The test can becarried out as follows. The stage of a NextSeq® sequencer is moved tothe image quality tile (lane 1/3, swath 2, tile 4) of the Ubertargetapparatus. A course-focus is performed using red excitation to find bestfocus to within a few microns (step size is set to 6 microns, exposuretime is set to 150 ms and LED currents are set to the values calculatedduring LED calibration). A fine through-focus stack is collected in redand green (step size is set to 1 micron, exposure time is set to 150 msand LED currents are set to the values calculated during LEDcalibration). Image processing is performed on the fine though-focusimages to determine FWHM best focus average in the red channel, FWHMbest focus average in the green channel, chromatism, and best focus ztop in the green channel.

A laser z bias test can also be performed, for example, as follows. Thexy stage of a NextSeq® sequencer is moved to the autofocus tile at lane1/3, swath 3, tile 10 of the Ubertarget apparatus. Course through-focusis done in the red channel to determine the approximate best-focus pointfor red. Fine through-focus is done in red to determine the best-focus Zheight for red (step size is 2 microns, exposure time is 4 ms, LEDcurrent is set to the value determined during LED calibration). Laserthrough focus is performed as a step size of 5 microns with exposuretime set to the value determined during laser calibration. Laser imagesare analyzed to determine the z coordinate where the laser spot from topsurface is at best-focus. If undesirable results are obtained, then thelaser through-focus stack is repeated at the neighboring tile at lane1/3, swath 3, tile 9 of the Ubertarget.

An inspection method of the present disclosure can include a routine fortesting the camera-to-camera XY offset. The NextSeq® imaging modulecontains 6 microfluorometers in a monolithic read head, eachmicrofluorometer having a dedicated camera. The results of this routinewill indicate the relative xy position of the camera detection zones atthe sample stage. The routine can be carried out as follows. The xystage is positioned so all cameras are looking at their first lane,first tile fiducials in the Ubertarget apparatus. Fiducial images arecaptured for all cameras. Fiducial xy locations are calculated for eachcamera. Camera 2 is used as a reference and all other cameras' xyoffsets are calculated relative to camera 2. Repeatability of thisroutine was found to result in a variance of less than 1 μm in the x andy dimensions.

A further routine that can be included in an inspection method isdetermination of xy stage position repeatability and hysteresis. Theresults of the test will indicate how repeatably the xy stage can becorrectly positioned when approaching a location from differentdirections. This will indicate how much hysteresis (slop) is in thestage's movement. The routine can be carried out as follows in referenceto FIG. 16A. The test is conducted using camera 2, lane 1, starting atswath 2, tile 10, which has a fiducial as indicated by the “+” symbol inFIG. 16A. The xy stage is moved one tile over from target tile 10, thenmoved back to the target tile and the xy position of the fiducial isrecorded. This test is repeated 30 times, approaching the target tilefrom all 4 directions as indicated by the arrows in FIG. 16A. The xyposition repeatability for each stage position is the standard deviationof the fiducial position after the move. Hysteresis is the differencebetween fiducial average positions when approaching from the positiveand negative directions. FIG. 16B shows hysteresis in the y dimensionthat is identified from fiducial position changes in images due tomovement in the positive and negative directions of the xy stage alongthe y dimension. Repeatability of this routine was found to result in avariance of less than 1 μm in the x and y dimensions.

An xy stage test for z wedge down the lane and between lanes can also beperformed. The results of the test indicate the change in best-focus zposition going down the length of the lanes and going from lane 1 tolane 2 (i.e. from the region of the Ubertarget apparatus correspondingto the first channel of a flow cell to the region corresponding to thesecond channel of the flow cell). The test procedure uses camera 2.Through-focus is done on the fiducial and best-focus z is calculated atthe following tiles: lane 1, swath 2, tiles 1 and 10 and lane 2, swath2, tile 1. The z wedge down the lane is the change in best-focus zbetween tile 1 and tile 10. The z wedge from lane to lane is the changein best-focus z between lane 1 and lane 2. The measurement repeatabilityusing the Ubertarget apparatus on the NextSeq® imaging module was foundto be 16 nm (1σ) for best-focus z position at each location.

A test for autofocus error can be performed. For example, the test canbe done by moving the xy stage of a NextSeq® sequencer to the autofocustile at lane 1/3, swath 3, tile 1 of the Ubertarget apparatus. A coursethrough-focus is done in the red channel to determine approximate bestz. A focus model is generated using default settings (step size is 2microns and z range is +/−18 microns). Two hundred random moves in the zdimension are performed in the range of +/−20 microns from best-focus.After each move, a laser image is captured and the distance frombest-focus is calculated using the focus model. The calculated distanceto move is compared to the known random move that was performed. The zstage is moved by the calculated distance from best focus. Another laserimage is obtained and the distance from best-focus is calculated usingthe focus model. The calculated distance from best focus is compared tothe actual best-focus position.

Focus model repeatability can be tested in a routine, for example, asfollows. The xy stage of a NextSeq® sequencer is moved to the autofocustile at lane 1/3, swath 3, tile 1 of the Ubertarget apparatus. A coursethrough-focus is done in the red channel to determine approximate bestz. A focus model is generated using default settings (step size is 2microns and z range is +/−18 microns). The xy stage is moved to theextremes of travel in both dimensions and then back to the autofocustile at lane 1/3, swath 3, tile 1. This is intended to simulatevibration in the optics in the same manor that may occur during ananalytical procedure (e.g. nucleic acid sequencing). The steps ofgenerating the focus model and moving the xy stage to extremes of travelare repeated 20 times. The y spot position at best focus and the focusmodel gain are compared from each of the focus models that weregenerated.

FIG. 17 shows an image of an autofocus tile of the Ubertarget apparatus.The tile includes a chrome covered area with 5 micron holes at 15 micronspacing. The resulting pattern can be used to determine best focus. Themiddle of the image shows a relatively large opening in the chromepattern. The opening allows the autofocus laser of each microfluorometerin the NextSeq® imaging module to pass through and generate lane top andlane bottom reflections. The shape and sharpness of the resulting imagesare used to determine focus.

A photograph of an image quality tile is shown in FIG. 18. A relativelylarge field of view is shown in the left image along with a highermagnification image at the right. The image is produced from a tilehaving a chrome coating with 1 micron holes spaced 15 microns apart. Inparticular embodiments the tolerance in hole size variation is +/−50 nm,which allows for a desired level of accuracy in calibrationmeasurements. The resulting square grid of objects is useful forrevealing barrel distortion in an imaging system. The holes producespots in the image that produce about 3300 counts on the imaging systemwhereas the background (interstitial) areas produce 400 counts.

Simple object detection and analysis was successful using the Ubertargetimage quality through-focus test. The consistency of object spacing andobject sizes in the Ubertarget image quality tile enabled analyzing theimages at finer detail. Images were analyzed on a 18×24 grid. Thisresults in detection of about 30 objects per subtile.

The optical density of the chrome layer on the Ubertarget apparatus wasmeasured using a green laser of the NextSeq® imaging module focused ontothe filter breakthrough tile. The power measured through a tile with nochrome was 4.10 mW. The power measured through the filter breakthroughtile (all chrome) was far lower at 0.020 mW. From this test it wasdetermined that radiation density of 1 part in 500 makes it through thechrome (i.e. an optical density of 2.3).

An inspection method of the present disclosure can include a routine fordetermining autofluorescence and filter breakthrough. The test can beused to determine how much excitation light (e.g. from an LED of aNextSeq® imaging module) makes it to a detector (e.g. a camera of aNextSeq® imaging module). The test can also indicate how much theUbertarget apparatus glass autofluoresces. The test can be carried outon a NextSeq® imaging module as follows. Measurements are taken withLEDs at 50% current and exposure time of 999 ms. An image is obtainedwith the LEDs off to provide a dark read. Then an image is obtained overthe mirrored surface provided at the filter breakthrough tile (solidchrome layer). This measurement indicates how much LED light gets to thesensor. Then an image is obtained over the open area of the lane with nochrome (uniformity tile). This measurement indicates how much theUbertarget apparatus glass autofluoresces. Then an image can be obtainedwith the Ubertarget apparatus removed. This measurement indicates howmuch of the detected signal is due to the fixturing of the image module.The resulting measurements are shown in Table I.

TABLE I Autofluorescence and filter breakthrough experiment resultsGreen Intensity Red Intensity Measurement condition (counts) (counts)LEDs off 170 170 Solid chrome (filter breakthough) tile with 1300 1100no dye solution in lane Chrome-free (uniformity) tile with no dye 1050800 solution in lane With Ubertarget apparatus removed 650 600

The results of Table I indicate that the autofluorescence of theUbertarget apparatus glass is 400 counts (green channel) and 200 counts(red channel). The amount of LED light that reflects off the chrome andhits the sensor is 700 counts (green channel) and 700 counts (redchannel).

Nearly all measurements taken on the NextSeq® imaging module using theUbertarget apparatus were highly repeatable, indicating a robust toolfor investigating image system performance.

Throughout this application various publications, patents and patentapplications have been referenced. Their disclosures are herebyincorporated by reference in this application, in their entireties, inorder to more fully describe the state of the art to which thisinvention pertains.

The term “comprising” is intended herein to be open-ended, including notonly the recited elements, but further encompassing any additionalelements.

Although the invention has been described with reference to the examplesprovided above, it should be understood that various modifications canbe made without departing from the invention. Accordingly, the inventionis limited only by the claims.

1. An inspection apparatus comprising: (a) a translucent or transparentplate having a bottom surface, at least a portion of the bottom surfacehaving an opaque material printed thereon in a pattern having at leastone transparent or translucent portion, wherein the pattern comprises aplurality of translucent or transparent holes in an ordered array; (b) achannel disposed below the bottom surface, wherein the channel comprisesa plurality of parallel lanes that are connected to form a singlechamber, whereby light emitted from the channel or through the channelcan pass through the at least one transparent or translucent portion. 2.The apparatus of claim 1, further comprising: (c) a fluid filling atleast a portion of the channel, the fluid comprising at least one lightemitting material. 3-4. (canceled)
 5. The apparatus of claim 1, furthercomprising a second plate in contact with the translucent or transparentplate, wherein the channel opening is disposed between the translucentor transparent plate and the second plate.
 6. The apparatus of claim 1,wherein the pattern comprises at least one translucent or transparentfeature forming a fiducial element. 7-8. (canceled)
 9. The apparatus ofclaim 1, wherein the bottom surface comprises at least one patternedtile comprising the opaque material.
 10. The apparatus of claim 9,wherein the bottom surface further comprises at least one transparenttile that lacks the opaque material.
 11. (canceled)
 12. The apparatus ofclaim 9, wherein the opaque material comprises a plurality oftransparent or translucent holes having an area less than 75 squaremicrons.
 13. The apparatus of claim 12, wherein the opaque materialcomprises a plurality of transparent or translucent holes that areseparated by at least 10 microns. 14-15. (canceled)
 16. The apparatus ofclaim 9, wherein the tiles are arranged in a unit on the bottom surfaceand the unit is repeated six times to form a pattern on the bottomsurface.
 17. (canceled)
 18. The apparatus of claim 1, wherein theplurality of parallel lanes include detection lanes that are relativelywide compared to an ingress lane and an egress lane that are relativelynarrow.
 19. (canceled)
 20. An optical detection device, comprising (a)an inspection apparatus of claim 1, and (b) one or more detectorsdisposed above the plate to receive the light that is emitted from thechannel or through the channel.
 21. The optical device of claim 20,wherein the one or more detectors comprise a plurality ofmicrofluorometers.
 22. (canceled)
 23. The optical device of claim 21,wherein the one or more detectors comprise six microfluorometers, andwherein the inspection apparatus comprises four lanes, wherein thebottom surface of the inspection apparatus comprises at least onepatterned tile comprising the opaque material, and wherein the sixmicrofluorometers are positioned to detect at least one of the patternedtiles, wherein the at least one patterned tile is entirely coated by theopaque material, wherein the opaque material comprises a plurality oftransparent or translucent holes having an area less than 75 squaremicrons, and wherein the transparent or translucent holes are separatedby at least 10 microns. 24-29. (canceled)
 30. A method of evaluating animaging module comprising: (a) positioning an imaging module in opticalalignment with the inspection apparatus of claim 1; and (b) detectinglight transmitted through one or more of the transparent or translucentportions.
 31. The method of claim 30, further comprising (c) determiningaccuracy of the optical alignment based on the light that is detected.32. The method of claim 30, further comprising (c) determining autofocusaccuracy of a detector that detects the light that is detected.
 33. Themethod of claim 30, further comprising (c) finding a fiducial on theinspection apparatus based on the light that is detected.
 34. The methodof claim 30, further comprising (c) setting excitation source currentsbased on the light that is detected when using the excitation source toirradiate the inspection apparatus.
 35. The method of claim 30, furthercomprising (c) calibrating an excitation source based on the light thatis detected when using the excitation source to irradiate the inspectionapparatus.
 36. The method of claim 30, further comprising (c)calibrating a detector that detects the light that is detected.
 37. Themethod of claim 30, further comprising (c) determining an imageuniformity correction or flat field correction based on the light thatis detected.
 38. The method of claim 30, further comprising (c)determining z bias in an excitation source based on the light that isdetected when using the excitation source to irradiate the inspectionapparatus.
 39. The method of claim 30, further comprising (c)determining camera-to-camera xy offset based on the light that isdetected.
 40. The method of claim 30, further comprising (c) determiningrepeatability of xy stage positioning or hysteresis in xy stagepositioning based on the light that is detected.
 41. The method of claim30, further comprising (c) determining focus repeatability based on thelight that is detected.